Optimize your testing process with the Test Socket 1932LD, designed specifically for high-performance applications requiring precise and reliable connections. Supporting a 1932-pin LGA (Land Grid Array) package, this socket ensures stable electrical contact and superior signal integrity for advanced semiconductor devices. Built for both engineering and high-volume production testing, the Test Socket 1932LD is engineered for durability, fast setup, and minimal downtime, making it an essential component for any testing environment where accuracy is crucial.
Key Feature: Supports 1932-pin LGA packages with excellent contact resistance, providing high-speed, high-accuracy testing for large-scale ICs.
Enhance your testing capabilities with the Test Socket 1932LD, where performance, precision, and efficiency meet.
More detail about FUJIM DIGITAL SDN. BHD.
Malaysia
